When You Apply | ONDA TECHNO Intl. Patent Attys.[Japan Patent Firm] | Gifu City

When You Apply | ONDA TECHNO Intl. Patent Attys.[Japan Patent Firm] | Gifu City

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FAQs

Japanese Design FAQs

When You Apply

Q.What is necessary for filing an application (based on the Paris Convention)?

A.

When filing a Japanese design application, the following documents and information are needed.

a. A copy of the drawings;
b. The full name and address of each creator;
c. The full name and address of each applicant;
d. The name of article to which the design is applied;
e. The filing date, application number and country of the priority application; and
f. The priority document (can be filed within 3 months from the Japanese filing date).

Q.What is required for drawings?

A.

The Japanese Patent Office requires at least six views such as front, rear, left side, right side, top plan and bottom plan views.  These views must be consistent with each other both in size and shape.  Additional drawings such as perspective and cross-sectional views also may be submitted.

Q.Is it acceptable to file photographs with the Japanese Patent Office as formal drawings?

A.

Yes. Photographs are acceptable for a Japanese design application. Please note that the Japanese Patent Office requires at least six views (see no. 2 above). The maximum size of the photographs is 150mm (width) x 113mm (length). When you provide us with your filing instructions, please provide us with an electronic copy of the photographs in jpg format, if possible, in order to maintain image clarity.

Q.Are any executed documents required for filing an application?

A.

No executed documents are required for filing an application. However, a power of attorney is needed when special representation becomes necessary, such as when an appeal or an opposition is to be filed. We will let you know if a power of attorney is necessary.

Q.Is it possible to file a request for examination?

A.

No. All design applications are examined automatically, without the need for a request for examination.